Approved
Integration of a Digital Built-in Self-Test for On-Chip Memories
Masoud Nouripayam () and Xiao LUO ()
Start
2017-05-02
Presentation
2017-12-04 11:00
Location:
E:3139
Finished:
2017-12-12
Master's thesis:
Abstract
Supervisor: Joachim Rodrigues (EIT)
Examiner: Pietro Andreani (EIT)