- D. Vlastaras, S. Malkowsky, F. Tufvesson:
Stress Test Of Vehicular Communication Transceivers Using Software Defined Radio
81st Vehicular Technology Conference, Glasgow, Scotland, 2015-05-11. - M. Nagata, L. J. Breems, C. Samori, S. Mattisson, P. K. Hanumolu:
Introduction to the Special Issue on the 2014 IEEE International Solid-State Circuits Conference (ISSCC)
IEEE Journal of Solid-State Circuits, Vol. 49, No. 12, pp. 2743-2747, 2014. - B. K. Lau, H. Arai, D. Manteuffel, S. V. Hum:
IEEE Transactions on Antennas and Propagation Announces a Special Issue on Theory and Applications of Characteristic Modes
IEEE Antennas and Propagation Magazine, Vol. 56, No. 4, 2014. - C. Zota, G. Roll, L. E. Wernersson, E. Lind:
Radio-Frequency Characterization of Selectively Regrown InGaAs Lateral Nanowire MOSFETs
IEEE Transactions on Electron Devices, Vol. 61, No. 12, pp. 4078-4083, 2014.
Electrical and Information Technology
Faculty of Engineering LTH | Lund University
Wrong went right for DimitarDimitar Nikolov is EIT's latest doctor and the title of his thesis is “Fault Tolerance for Real-Time Systems: Analysis and Optimization of Roll-Back Recovery with Checkpointing”. An appropriately long and comprehensive title, but what does it really mean? Advanced technology doesn't always work Technology has invaded our lives and we are surrounded by increasingly high-performing electronics. The ever more miniaturised semiconductor technology is vulnerable to faults and so despite the high performance, there is a risk that the electronics will stop working. At times this could have catastrophic consequences. |
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