Godkända
Utvärdering av testning av funktionella gränssnitt med hjälp av Boundary Scan
Chengwen Liu ()
Start
2023-06-01
Presentation
2024-11-07 10:15
Plats:
E2349
Avslutat:
2024-11-18
Examensrapport:
Sammanfattning
Before electronic products reach the market, Functional Circuit Testing (FCT) is essential to ensure performance and reliability. Traditional FCT requires developing dedicated test firmware for each batch of products, which increases both development costs and time. This thesis proposes a testing method based on Boundary Scan, provides an efficient alternative that eliminates the need for firmware development. To validate the feasibility of Boundary Scan, this thesis selects the Serial Peripheral Interface (SPI) protocol as case study. As SPI is a widely used communication protocol in electronic products, testing the SPI protocol through Boundary Scan provides an initial assessment of the potential for applying Boundary Scan in real FCT scenarios. This thesis uses two methods to implement Boundary Scan: one based on Open on-chip debugger (OpenOCD) software with a specific FT2232HL chip, and the other using an FPGA. Boundary Scan is implemented on a NUCLEO-F722ZE development board to facilitate SPI communication with another identical board. A comparison is made between the communication speeds and overall test times of the Boundary Scan method and the firmware-based method. The experimental results demonstrate that Boundary Scan can successfully perform SPI communication testing, and under lower communication content, it achieves lower overall test times compared to the firmware-based method.
Handledare: Erik Larsson (EIT)
Examinator: Christian Nyberg (EIT)