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- Referens:
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- Title:
- Band Structure Effects on the Scaling Properties of 111 InAs Nanowire MOSFETs
IEEE Transactions on Electron Devices
- Type:
- article
- Keywords:
- Band structure, field-effect transistor (FET), InAs, nanowire
- Abstract:
- We have investigated the scaling properties of 111 InAs nanowire MOSFETs in the ballistic limit. The nanowire band structure has been calculated with an Sp(3)d(5)s* tight-binding model for nanowire diameters between 2 and 25 nm. Both the effective band gap and the effective masses increase with confinement. Using the atomistic dispersion relations, the ballistic currents and corresponding capacitances have been calculated with a semianalytical model. It is shown that the InAs nanowire MOSFET with diameters scaled below 15-20 nm can be expected to operate close to the quantum capacitance limit, assuming a high-kappa dielectric thickness of 1-1.5 nm. We have also investigated the evolution of f (t) and the gate delay, both showing improvements as the device is scaled. The very small intrinsic gate capacitance in the quantum limit makes the device susceptible to parasitic capacitances.
- Year:
- 2009
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